AC-PGF Carbon Coated primarily designed for SEM sample

primarily designed for SEM sample preparation

Bruker's flagship RESP probes are the preferred choice for high-sensitivity silicon probe imaging in contact mode in air

MESP-LM-V2 (x3 Probes)

5 Tip Radius (Nom): 8 Tip Radius (Max): 12 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25

Each probe tip is individually imagedby FE-SEM to verify that the metallic probe tip radius is below 20nm

AC-PGF Carbon Coated primarily designed for SEM sampleDESCRIPTION This kit is used to mount most commercially available afm probes onto pre aligned substrates for easy installation and alignment in the afm+ and nanoIR systems. Includes a precision machined mount which references the probes in the correct position on the half washer. Up to 7 probes can be glued at one time. Also includes one 100 pack of cantilever mounts. Additional mounts can be purchased separately (Model #EX CM)