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ESP/ESPA AFM probes
A pack of 10 High quality etched silicon probes for soft TappingMode™imaging and force modulation in air
The Sample Bias Holder is included in the Scanning Capacitance Microscopy (SCM) option
Tip Geometry: Rotated Tip Height: 10 - 15 Front Angle: 17
Symmetric Tip
ESP-V2 Carbon Coated ESP/ESPA AFM probes0. 2N m, 13kHz, 4 Sided Tip, No Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for contact mode imaging in air. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular, ESP ESPA AFM probes. Brukers new line of ESP high quality premiumetched silicon probes set the industry standard for contact mode in air. The new design
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