SEM Magnification Standard and Stage Micrometer MRS-4 - Modification SPM Tools Optional retainer & mounting available

Optional retainer & mounting available

c) Polyethylene terephthalate (PET

High aspect ratio probe based upon Bruker technology and made from our TESP

Incorporated into the standard are X & Y rulers with 6mm length with 1µm increments

- Topography imaging in PeakForce Tapping

SEM Magnification Standard and Stage Micrometer MRS-4 - Modification SPM Tools Optional retainer & mounting availableDESCRIPTION Modify the MRS 4 to 3mm diameter x 0. 5mm thickness to fit into a TEM style holder. For use only in secondary or backscattered mode, not transmitted The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies