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VITA nTA Calibration Sample Set consisting of three polymer samples with known transition temperatures
Rapid source offset adjustment
15 and 20mm AFM/STM discs in a dust-free environment
25°-30° from side
PELCO® ESD Safe
Low profile flat FIB pin mount Unit:pkg/10 VITA nTA Calibration Sample SetDESCRIPTION These special low profile pin mounts are available as flat, as a 90 mount, and with specific angles ideally suited to accommodate specimens with small working distances in FIB, DualBeam and CrossBeam systems. Made out of aluminum. Fully compatible with standard pin stub mounts (pin 3. 2mm diameter) for sample storage and transport. These mounts can be used directly in FEI and TESCAN systems with the standard pin length and ZEISS LEO
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